Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-07-19
1998-03-03
Hantis, K.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 501, 340903, 250573, G01B 1114
Patent
active
057241414
ABSTRACT:
A distance measuring apparatus has: light receiving means for receiving light which is emitted from a light emitting element unit and reflected from an obstacle having a reflecting surface, a pair of members of high reflection performance being respectively disposed on portions of the reflecting surface; and a calculating circuit for calculating a distance from the obstacle on the basis of a time period between the emission and the reception of the light. According to the apparatus, in a measurement range of a short distance where light reflected from a reflecting surface positioned between the pair of members of high reflection performance is received, the maximum amount of light received by the light receiving means is set to be smaller than a sensitivity at which a snowfall is detected, and the minimum amount of light is reduced to a level at which an obstacle positioned at the short distance can be detected.
REFERENCES:
patent: 3587040 (1971-06-01), Fathauer
patent: 3604805 (1971-09-01), Scott
patent: 4699507 (1987-10-01), Etoh
patent: 4760272 (1988-07-01), Wang
patent: 4880307 (1989-11-01), Endo et al.
patent: 5283622 (1994-02-01), Ueno et al.
Hantis K.
Kansei Corporation
LandOfFree
Distance measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Distance measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Distance measuring apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2253455