Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2007-03-13
2007-03-13
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S155000
Reexamination Certificate
active
09873447
ABSTRACT:
A method of inspecting a display panel, which is capable of distinguishing between whether an EL panel is a good product or a defective product before sealing of the display panel, is provided. In a first method of inspection, a conductive film is patterned to forming pixel electrodes after measuring the electric current flowing in the conductive film and detecting defective pixels in accordance with the measured values. In a second method of inspection, all of the pixel electrodes are connected by an inspection conductive film, a value of electric current flowing in the inspection conductive film is measured, and the inspection conductive film is removed after detecting defective pixels in accordance with the measured values.
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Arai Yasuyuki
Koyama Jun
Yamazaki Shunpei
Perkins Pamela E
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
Smith Zandra V.
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