Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2011-08-30
2011-08-30
Louie, Wai Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S040000, C257S083000, C257S084000, C257S187000, C257S257000
Reexamination Certificate
active
08008660
ABSTRACT:
A display apparatus includes a substrate; a display area including a plurality of pixels provided on the substrate; a switching element provided for each of the pixels, the switching element including a first semiconductor layer formed of a first organic semiconductor; and a humidity sensor provided on the substrate and outside the display area. The humidity sensor includes, as a humidity sensitive layer, a second semiconductor layer formed of a second organic semiconductor having a correlation in terms of electric characteristics with the first organic semiconductor.
REFERENCES:
patent: 2002/0089497 (2002-07-01), Yudasaka
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patent: 2007-256914 (2007-10-01), None
patent: 424058 (1974-09-01), None
Moriya Soichi
Nakamura Kiyoshi
AdvantEdge Law Group, LLC
Louie Wai Sing
Seiko Epson Corporation
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