Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-07-10
1997-03-11
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
2502014, 250237G, 25055929, G01B 1100
Patent
active
056107196
ABSTRACT:
A system for detecting displacement of a surface in a direction normal to the surface, the system including a first grating; a second grating; an optical subsystem for projecting an image of the first grating onto the surface and for directing a secondary image of the first grating reflected off the surface onto the second grating; and a detector, responsive to the fringe pattern formed after the secondary image passes through the second grating, for detecting displacement of the surface in a direction normal to the surface.
REFERENCES:
patent: 3858981 (1975-01-01), Jaerisch et al.
patent: 4009386 (1977-02-01), Deml et al.
Allen Nicholas
Broude Sergey
Broudour Abdu
Chase Eric
Johnson Carl
Evans F. L.
QC Optics, Inc.
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