Discrete die burn-in for nonpackaged die

Details Discrete die burn-in for nonpackaged die Discrete die burn-in for nonpackaged die

1988-09-30

1990-02-06

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158R, 324 731, G01R 3128, G01R 3102

Patent

active

048991074

ABSTRACT:
A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture is a die cavity plate for receiving semiconductor dice, and contains cavities in which die are inserted. The second half establishes electrical contact with the dice and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. After burn-in stress and electrical test, the die are removed from the test fixture and depositioned accordingly. The technique will allow all elements of the burn-in/test fixture to 100% reusable.

REFERENCES:
patent: 4281449 (1981-08-01), Ports et al.
patent: 4500836 (1985-02-01), Staudacher
patent: 4739257 (1988-04-01), Jenson et al.
patent: 4766371 (1988-08-01), Moriya
Microelectronics Packaging Handbook, Tummala, Rao R., 1942-, Copyright 1989 by V. Reinhold, Library of Congress 88-14254; pp. 4-11.

Affiliated with

Also associated with

Rating

Discrete die burn-in for nonpackaged die does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Discrete die burn-in for nonpackaged die, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Discrete die burn-in for nonpackaged die will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-443672