Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2009-09-14
2011-11-08
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C365S201000
Reexamination Certificate
active
08055959
ABSTRACT:
Articles and associated methods and systems relate to disabling defective flash memory dies in a device containing multiple flash memory dies. Packages containing multiple flash memory dies may be labeled to indicate a flash memory data storage capacity based on the flash memory dies that are not disabled. Various disabling methods may be applied at the die level, package level, and/or board level.
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Cornwell Michael J.
Dudte Christopher P.
Apple Inc.
Fish & Richardson P.C.
Kerveros James C
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