Digital test apparatus for testing analog semiconductor...

Details Digital test apparatus for testing analog semiconductor... Digital test apparatus for testing analog semiconductor...

2006-01-26

2008-09-09

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07423444

ABSTRACT:
A digital test apparatus for testing an analog semiconductor device includes a low pass filter which passes only a low frequency analog signal from among analog signals output from the analog semiconductor device, a rectifying unit connected to the low pass filter for converting the analog signal output from the low pass filter into a DC voltage, a high pass filter which passes only a high frequency analog signal from among analog signals output from the analog semiconductor device, a high frequency power detecting unit connected to the high pass filter for converting the analog signal output from the high pass filter into a DC voltage, and a digital measuring unit which is connected to the rectifying unit and the high frequency power detecting unit and measures the DC voltages to determine whether the analog signals output from the analog semiconductor device are desirable.

REFERENCES:
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patent: 4926351 (1990-05-01), Wratil et al.
patent: 5191956 (1993-03-01), Ibarrola
patent: 5883523 (1999-03-01), Ferland et al.
patent: 6801478 (2004-10-01), Nishimoto
patent: 7054778 (2006-05-01), Geiger et al.
patent: 7173443 (2007-02-01), Asami
patent: 2000221248 (2000-08-01), None
patent: 2001 0305193 (2001-10-01), None
patent: 2006215036 (2006-08-01), None
patent: 1999 0035473 (1999-05-01), None
patent: 2001 0051609 (2001-06-01), None
English Abstract*** for 0035473 Korean, 1999.
English Abstract*** for 0305193 Japan, 2001.
English Abstract*** for 0051609 Korean, 2001.

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