Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Inventor
active
Digital test apparatus for testing analog semiconductor...
Digital test apparatus for testing analog semiconductor...
No associations
LandOfFree
Jung-Hye Kim does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Jung-Hye Kim, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jung-Hye Kim will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-3126969