Digital temperature detection circuit for semiconductor device

Details Digital temperature detection circuit for semiconductor device Digital temperature detection circuit for semiconductor device

2006-11-15

2008-08-19

Zweizig, Jeffrey S (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

External effect

Temperature

Reexamination Certificate

active

07414455

ABSTRACT:
A digital temperature detection circuit for a semiconductor circuit comprises a digital temperature defection block and a data conversion block. The digital temperature detection block is adapted to detect an internal temperature of the semiconductor device and generate detection data having a data value that varies according to the detected internal temperature. The data conversion block is adapted to convert the detection data into standard data with a predetermined response interval using first and second sample data having respective data values that are determined by input from an external source.

REFERENCES:
patent: 7075847 (2006-07-01), Kim et al.
patent: 7281846 (2007-10-01), McLeod
patent: 1020010103986 (2000-05-01), None
patent: 1020020091657 (2001-05-01), None
patent: 1020040013885 (2002-08-01), None
Anton Bakker, Johan H. Huijsing, Micropower CMOS Temperature Sensor with Digital Output, IEEE Journal of Solid-State Circuits, Jul. 1996, pp. 933-937, vol. 31, No. 7.

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