Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2007-01-18
2009-06-23
Caputo, Lisa M (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S001000, C374S171000, C327S512000, C327S513000, C702S130000
Reexamination Certificate
active
07549796
ABSTRACT:
A digital temperature detection circuit adapted for use with a semiconductor device is disclosed. The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into perception data in accordance with a perception data code, and output the perception data. The digital temperature detection circuit further comprises an offset shift unit adapted to shift the perception data in accordance with offset data to thereby generate standard data; and, an offset generation unit adapted to generate the offset data, wherein the offset generation unit is controlled from outside of the digital temperature detection circuit.
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Chun Byung Kwan
Nam Jeong Sik
Caputo Lisa M
Jagan Mirellys
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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