Digital storage element architecture comprising dual scan...

Details Digital storage element architecture comprising dual scan... Digital storage element architecture comprising dual scan...

2008-05-20

2008-05-20

Wells, Kenneth B. (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Particular stable state circuit

C327S218000

Reexamination Certificate

active

07375567

ABSTRACT:
A digital storage element comprising a master transparent latch that receives functional data from a data input port and scan data from a scan input port and comprises a master feedback loop with a first transistor coupled to the master feedback loop. The first transistor also is coupled to electrical ground. The digital storage element also comprises a slave transparent latch coupled to the master transparent latch, the slave transparent latch comprising dedicated functional data and scan data output ports, a slave feedback loop and a second transistor coupled to the slave feedback loop. The second transistor is coupled to electrical ground. When a clock signal is in a first state, the first single transistor is activated to preset the digital storage element. When the clock signal is in a second state, the second single transistor is activated to preset the digital storage element.

REFERENCES:
patent: 5015875 (1991-05-01), Giles et al.
patent: 5812561 (1998-09-01), Giles et al.
patent: 6389566 (2002-05-01), Wagner et al.
patent: 6501315 (2002-12-01), Nguyen
patent: 2004/0075479 (2004-04-01), Gupta
patent: 2005/0091562 (2005-04-01), Krishnamoorthy et al.
Khan, Waheed U. et al., U.S. Appl. No. 10/952,289, filed Sep. 28, 2004, entitled, “High Speed Energy Conserving Scan Architecture,” 18 pages including 4 pages of Formal Drawings.

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