Electronic digital logic circuitry – Reliability – Fail-safe
Reexamination Certificate
2007-06-26
2007-06-26
Barnie, Rexford (Department: 2819)
Electronic digital logic circuitry
Reliability
Fail-safe
C326S083000
Reexamination Certificate
active
11231673
ABSTRACT:
A circuit and a method are given, to realize an electronic system for combined usage at differing voltage ranges as defined by a low-voltage range for operating standard CMOS devices and a high-voltage range exceeding said standard CMOS low-voltage operating range significantly by multiples and thus necessarily utilizing input ports with an intrinsic high-voltage protection feature. Said circuit and method are designed in order to be implemented with a very economic number of components, capable to be realized with standard modern integrated circuit technologies in CMOS technology.
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An Internal Technical Report by Rainer Krenzke et al., of Oct. 2004, “A 36-V H-Bridge Driver Interface in a Standard 0.35-μm CMOS Process”.
Krenzke Rainer
Salzmann Oliver
Ackerman Stephen B.
Barnie Rexford
Crawford Jason
Dialog Semiconductor GmbH
Saile Ackerman LLC
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