Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-08
2008-07-08
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
11330676
ABSTRACT:
A technique for analyzing digital circuits to identify pin swaps is provided for circuit layout and similar tasks in which the circuit is first decomposed into regions. Logic functions of the regions are decomposed into a directed graph of the logic functions. A swap structure is created in accordance with the directed graph to facilitate identification of input equivalences.
REFERENCES:
patent: 5349659 (1994-09-01), Do et al.
patent: 5414716 (1995-05-01), Bershteyn
patent: 5436849 (1995-07-01), Drumm
patent: 5448497 (1995-09-01), Ashar et al.
patent: 5524082 (1996-06-01), Horstmann et al.
patent: 5526276 (1996-06-01), Cox et al.
patent: 5610829 (1997-03-01), Trimberger
patent: 5752000 (1998-05-01), McGeer et al.
patent: 5774369 (1998-06-01), Horstmann et al.
patent: 5896401 (1999-04-01), Abramovici et al.
patent: 6023566 (2000-02-01), Belkhale et al.
patent: 6070261 (2000-05-01), Tamarapalli et al.
patent: 6086626 (2000-07-01), Jain et al.
patent: 6212669 (2001-04-01), Jain
patent: 6360352 (2002-03-01), Wallace
Chandrasekhar et al., “Application of Term Rewriting Techniques to Hardware Design Verification”, 24thACM/IEEE Conference Proceedings on Design Automation Conference, pp. 277-282, Jun. 1987.
Perkowski et al., Fast Minimization of Mixed-Polarity AND/XOR Canonical Networks, IEEE 1992 Conference on Computer Design, pp. 33-36.
Cong et al., Exploiting Signal Flow an dLogic Dependcy in Standard Cell Placement, 1995 Design Automation conference, pp. 399-404.
Choy et al., Test Generation with Dynamic Probe Points in High Observability Testing Enironment, IEEE Tranactions on Cmputers, vol. 45, Issue 1, pp. 88-96, Jan. 1996.
Cong et al., An Improved Graph-Based FPGA Technology Mapping algorithm for Delay Optimization, IEEE 1992 International Conference on VLSI in Computers and Processors, pp. 154-158, Apr. 1992.
Wallace, High Level Delay Estimation for Technology-Independent Logic Equations, 1990 IEEE International Conference on Computer Aided Design, pp. 188-191, Nov. 1990.
Prabhu, “A Multi-Level Logic Synthesis and Optimization System”, 1989 IEEE Custom Integrated Circuits Conference, pp. 4.1/1-4.1/4, May 1989.
Nagoya et al., Multi-Level Logic Optimization for Large Scale ASICs, 1990 IEEE International Conference on Computer Aided Design, pp. 564-567, Nov. 1990.
Chandrasekhar et al., “Effective Coupling between Logic Synthesis and Layout Tools for Synthesis of Area and Speed-Efficient Circuits”, VLSI Design, 1997, vol. 5, No. 2, pp. 125-140.
Brasen et al., Post-Placement Buffer Reoptimization, 1992 IEEE, pp. 156-161.
Bertacco et al., “Boolean Function Representation Based on Disjoint-Support Decompositions”, ICCD96, IEEE Computer Society Press, Los Alamitos, CA, USA, Oct. 1996, pp. 27-32.
Bertacco et al., “The Disjunctive Decomposition of Logic Functions”, ICCD97, IEEE Computer Society Press, Los Alamitos, CA, USA, Nov. 1997, pp. 78-82.
Chang et al., “Layout Driven Logic Synthesis for FPGAs”, DAC94, Jun. 1994, pp. 308-313.
Chong et al., “Don't Care Wires in Logical/Physical Design”, International Workshop on Logic Synthesis (IWLSOO), Nov. 1, 1999, pp. 1-9.
Entrena et al., “Sequential Logic Optimization by Redundancy Addition and Removal”, ICCAD93, IEEE Computer Society Press, Los Alamitos, CA, USA, Nov. 1993, pp. 310-315.
Heineken et al., “Interconnect Yield Model for Manufacturability Prediction in Synthesis of Standard Cell Based Designs”, ICCAD96, IEEE Computer Society Press, Los Alamitos, CA, USA, Nov. 1996, pp. 368-373.
Yusuke Matsunaga, “An Exact and Efficient Algorithm for Disjunctive Decomposition”, SASIMI98, Oct. 1998, pp. 44-50.
Moller et al., “Detection of Symmetry of Boolean Functions Represented by ROBDDs”, ICCAD93, IEEE Computer Society Press, Los Alamitos, CA, USA, Nov. 1993, pp. 680-684.
Tsai et al., A High Speed Test Pattern Generator for Large Scan Designs, Dept. of E.C.E., University of California, Santa Barbara, CA, USA, no date.
Klarquist & Sparkman, LLP
Siek Vuthe
LandOfFree
Digital circuit layout techniques using binary decision... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Digital circuit layout techniques using binary decision..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Digital circuit layout techniques using binary decision... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3908713