Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Patent
1996-07-23
1997-09-16
Thomas, Tom
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
257915, 438653, H01L 2144, H01L 2943
Patent
active
056684118
ABSTRACT:
A diffusion barrier trilayer 42 is comprised of a bottom layer 44, a seed layer 46 and a top layer 48. The diffusion barrier trilayer 42 prevents reaction of metallization layer 26 with the top layer 48 upon heat treatment, resulting in improved sheet resistance and device speed.
REFERENCES:
patent: 5008216 (1991-04-01), Huang et al.
patent: 5093710 (1992-03-01), Higuchi
patent: 5118385 (1992-06-01), Kumar et al.
patent: 5202579 (1993-04-01), Fujii et al.
patent: 5231053 (1993-07-01), Bost et al.
patent: 5240880 (1993-08-01), Hindman et al.
patent: 5242860 (1993-09-01), Nulman et al.
patent: 5270254 (1993-12-01), Chen et al.
patent: 5275973 (1994-01-01), Gelatos
patent: 5312772 (1994-05-01), Yokoyama et al.
patent: 5312775 (1994-05-01), Fujii et al.
patent: 5313100 (1994-05-01), Ishii et al.
patent: 5345108 (1994-09-01), Kikkawa
patent: 5420072 (1995-05-01), Fiordalice et al.
patent: 5434044 (1995-07-01), Nulman et al.
patent: 5449641 (1995-09-01), Maeda
patent: 5523259 (1996-06-01), Merchant et al.
Kaizuka T. et al. "AL(111)/CVD-TiN(111) Stacked Film Formation Technique with High Aspect-Ratio Contact Hole Filling for Highly Reliable Interconnects", International Conference on Solid State Devices and Materials, Aug. 29, 1993, pp. 555-557.
Hideki Shibata, et al. "The Effects of AL(111) Crystal Orientation on Electromigration in Half-Micron Layered AL Interconnects", Japanese Journal of Applied Physics, Oct. 1, 1993, vol. 32, No. 10, Part 1, pp. 4479-4484.
B. Lee, E.C. Douglas, K. Pourrezaei, and N. Kumar, "Effect of Oxygen on the Diffusion Barrier Properties of TiN", VLSI Multilevel Interconnect Conference (VMIC) Proceedings, pp. 344-350, (1987).
M. Inoue, K. Hashizume, K. Watanabe, and H. Ysuchikawa, "The Properties of Reactive Sputtered TiN Films For VLSI Metallization", VMIC Proceedings, pp. 205-211, (1988).
H. P. Kattelus, J. Tandon, C. Sala, and M. -A. Nicolet, "Bias-induced Stress Transisitions in Sputtered TiN Films", J. Vac. Sci. Technol. A 4, pp. 1850-1854, (1986).
H. Joswig and W. Palmer, "Improved Performance of TiN-Diffusion Barriers After a Post-Treatment", VMIC Proceedings, p. 477, (1990).
W. Sinke, G. Frinjlink, and F. Saris, "Oxygen in Titanium Nitride Diffusion Barriers", Appl. Phys. Lett. 47, pp. 471-473, (1985).
T. Kikkawa, H. Aoki, J. Drynan, "A Quarter-Micrometer Interconnection Technology Using a TiN/Al-Si-Cu/TiN/Al-Si-Cu/TiN/Ti Multilayer Structure", IEEE Transactions on Electron Devices, vol. 40, No.2, Feb. 1993, pp. 296-302.
Havemann Robert H.
Hong Qi-Zhong
Jeng Shin-Puu
Brady III W. James
Donaldson Richard L.
Hardy David B.
Houston Kay
Texas Instruments Incorporated
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