X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1988-12-09
1991-04-16
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 84, 378207, 25039009, G01N 2320
Patent
active
050089080
ABSTRACT:
A periodic scattering array is used to diffract electromagnetic radiation or massive particles of specific wavelength and energy. A detector sutiable to the radiation or particles is integrated into the surface or bulk of the array. The detector is configured so as to not perturb the diffraction resolution of the array.
REFERENCES:
patent: 2619600 (1952-11-01), Hamacher
patent: 2816234 (1957-12-01), Ellis
patent: 3417026 (1968-12-01), Arthur
patent: 3642651 (1972-02-01), Marboe et al.
patent: 3772520 (1973-11-01), Varker
patent: 3833827 (1974-09-01), Shaffer
patent: 4261771 (1981-04-01), Dingle et al.
patent: 4447305 (1984-05-01), Heindl et al.
patent: 4751148 (1988-06-01), Popma et al.
patent: 4785470 (1988-11-01), Wood et al.
Afanas'ev, et al., "Diffraction of X Rays and Electrophysical Properties of rystals", JETP Lett., vol. 28, No. 6, American Institute of Physics, Sept. 20, 1978, pp. 321-324.
Afanas'ev, et al., "Photoelectric Phenomena Accompanying Diffraction of X Rays in Semiconducting Crystals", Sov. Phys. Solid State 24(9), American Institute of Physics, Sept. 1982, pp. 1473-1476.
Bedzyk, et al., "Detection of Interference Phenomena in Standing X-Ray waves in studying the internal photoeffect in a Schottky barrier", Sov. Phys. Dokl. 30(5), American Institute of Physics, May 1985, pp. 381-382.
Goossen, et al., "Grating Enhancement of Quantum Well Detector Response", Appl. Phys. Lett., 53(12), American Institute of Physics, Sept. 19, 1988, pp. 1027-1029.
Annaka, et al., "Variations in X-Ray Fluorescence from GaAs and Photocurrent in CdS due to Standing Waves of X-Rays", Japanese Journal of applied Physics, vol. 23, No. 12, Dec. 1984, pp. 1637-1639.
Carver Gary P.
Geist Jon C.
Jach Terrence J.
Novotny Donald B.
Blumenthal David A.
Englert Alvin J.
Fields Carolyn E.
Porta David P.
The United States of America as represented by the Secretary of
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