Differential phase contrast scanning transmission electron micro

Details Differential phase contrast scanning transmission electron micro Differential phase contrast scanning transmission electron micro

1990-01-24

1991-04-02

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

250307, 250397, H01J 3728

Patent

active

050049186

ABSTRACT:
A differential phase contrast scanning transmission electron microscope capable of obtaining a clear differential phase contrast image. This microscope includes a charge-coupled image sensor on which a diffraction image is projected. The region covered by the image sensor is divided into two parts by a straight line. The difference between the amounts of electrons impinging on these two parts is calculated, and the resulting differential signal is supplied to a display unit to display an image of the specimen.

REFERENCES:
patent: 3225192 (1965-12-01), Katagiri et al.
patent: 3500043 (1970-03-01), Hanssen
patent: 3908124 (1975-09-01), Rose
patent: 4149074 (1979-04-01), Schliepe et al.
patent: 4382182 (1983-05-01), Maksuzaka et al.
patent: 4691103 (1987-09-01), Le Poole et al.
"Double Gap Objective Lens for Observing Magnetic Domains by Means of Differential Phase Contrast Electron Microscopy", K. Tsuno and M. Inoue, Optik 67, No. 4 (1984), pp. 363-376.

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