Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-12-11
2007-12-11
Warren, Matthew E. (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S396000, C257S506000, C257SE29007, C257SE29020
Reexamination Certificate
active
11268131
ABSTRACT:
Integrated circuit field effect transistors include a substrate, an isolation region in the substrate that defines an active region in the substrate, spaced apart source/drain regions in the active region, a channel region in the active region between the spaced apart source/drain regions and an insulated gate on the channel region. A differential mechanical stress-producing region is configured to produce different mechanical stress in the channel region adjacent the isolation region compared to remote from the isolation region. The differential mechanical stress-producing region may be formed using patterned stress management films, patterned stress-changing implants and/or patterned silicide films, and can reduce undesired comer effects. Related fabrication methods also are described.
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Sun Min-Chul
Teh Young Way
Chartered Semiconductor Manufacturing Ltd.
Myers Bigel Sibley & Sajovec P.A.
Warren Matthew E.
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