Patent
1988-02-22
1990-05-22
James, Andrew J.
357 70, 357 52, 357 68, H01L 2328
Patent
active
049281623
ABSTRACT:
An improved semiconductor die for plastic encapsulated semiconductor devices which impedes the inherent delamination caused by the differing expansion coefficients of the semiconductor die and plastic encapsulation. Topological configurations are processed in the die corners of the semiconductor die which are void of circuitry. The topological configurations act as barriers and slow the delamination progression. This leaves the operational circuitry unaffected for an increased time thereby increasing device lifetime.
REFERENCES:
patent: 4625227 (1986-11-01), Hara et al.
Hawkins George W.
Lesk Israel A.
Rugg James M.
Thomas Ronald E.
Bowers Courtney A.
James Andrew J.
Motorola Inc.
Wolin Harry A.
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