Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2008-01-04
2011-11-08
Dunn, Drew A (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S115000, C702S127000, C702S182000, C702S185000
Reexamination Certificate
active
08055474
ABSTRACT:
The present invention relates to systems and methods for diagnosing undesirable events or the lack of desirable events representing product or process malfunctions. One aspect of the invention includes a method for determining a cause of a malfunction event in a prototype or production product or process. Another aspect of the invention includes a method for identifying evidence of deviation from a specification for a product or process. Still another aspect of the invention includes a method for ascertaining the reliability of a product or process. The present invention also provides a diagnostic computer system and computer program code for performing various methods embodying different aspects of the present invention. A computer system for training a user to diagnose and apply corrective action to a malfunctioning product or process is also provided.
REFERENCES:
patent: 5210704 (1993-05-01), Husseiny
patent: 5557557 (1996-09-01), Frantz et al.
patent: 2003/0147351 (2003-08-01), Greenlee
patent: 2007/0168174 (2007-07-01), Davari et al.
Kaufman, Jerry J., “Functional Analysis System Technique (FAST),” Value Engineering for The Practitioner, 3rd Ed. 1990, pp. 3-1 to 3-23; North Carolina State University, U.S.
Barker Aaron D.
Christensen Kory D.
Dunn Drew A
Henson Mi'schita'
Red X Holdings LLC
LandOfFree
Diagnostic systems and methods does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Diagnostic systems and methods, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Diagnostic systems and methods will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4311816