Diagnostic memory interface test

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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C714S738000

Reexamination Certificate

active

07062678

ABSTRACT:
Disclosed is a test method for a computer microprocessor adapted to stress the data transfer interfaces within a microprocessor. The method incorporates patterns designed to stress the interfaces and are further repeated in different widths such that interfaces of various bus widths are fully stressed. Further, the method begins with the various test patterns preloaded into memory to maximize the speed and thus the stress of the test.

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