Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2006-06-13
2006-06-13
Baderman, Scott (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S738000
Reexamination Certificate
active
07062678
ABSTRACT:
Disclosed is a test method for a computer microprocessor adapted to stress the data transfer interfaces within a microprocessor. The method incorporates patterns designed to stress the interfaces and are further repeated in different widths such that interfaces of various bus widths are fully stressed. Further, the method begins with the various test patterns preloaded into memory to maximize the speed and thus the stress of the test.
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Baderman Scott
Chu Gabriel L.
Cochran Freund & Young LLC
LSI logic Corporation
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