Diagnostic data port for a LSI or VLSI integrated circuit

Details Diagnostic data port for a LSI or VLSI integrated circuit Diagnostic data port for a LSI or VLSI integrated circuit

1994-08-22

1996-08-06

Nguyen, Viet Q.

Static information storage and retrieval

Read/write circuit

Testing

371 211, 371 221, H03K 19177, G06F 1126

Patent

active

055441076

ABSTRACT:
A two-wire dedicated diagnostic data port in an integrated circuit provides visibility for all internal functions of the integrated circuit. An internal signal or signals are written to a serially connected memory in the dedicated diagnostic data port. The serially connected memory is connected to a two-wire output port of the dedicated diagnostic data port. A first wire in the two-wire output port is a data wire and a second wire in said the wire output port is a clock wire. Transfer of the stored information from the serially connected memory to the two-wire output port is initiated by writing to a control register in the dedicated diagnostic data port. In response to writing to the control register, a clock signal on a clock input line to the dedicated diagnostic data port is coupled to the second wire, and is used to serially shift the stored information from the serially connected memory to the data wire. The signals on the two-wires from the integrated circuit are processed by a shift/latch control circuit that is external to the integrated circuit. A predetermined time after the clock signal on the clock wire terminates, i.e., remains inactive for a predetermined period, the shift/latch control circuit generates a latch signal that can be used to capture the data transmitted over the data wire.

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