Diagnosing method for logic circuits

Details Diagnosing method for logic circuits Diagnosing method for logic circuits

1986-11-26

1988-05-10

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

371 3, G01R 3100

Patent

active

047438401

ABSTRACT:
In a logic circuit which is logically divided into partial circuits each consisting of a logic block, data holding stages on the input and output sides therof, and a scan circuit segment associated with them, diagnostic data for a logic circuit section is obtained using the scan circuit segments in the respective partial circuits and wherein, only the scan circuit segments in the respective partial circuits are actuated to set values in the output side data holding stages and to read out the contents thereof as diagnostic test data for a scan circuit section.

REFERENCES:
patent: 4107649 (1978-08-01), Kurihara
patent: 4267463 (1981-05-01), Mayumi
patent: 4567593 (1986-01-01), Bashaw
patent: 4602210 (1986-07-01), Fasang et al.
patent: 4625313 (1986-11-01), Springer
patent: 4630270 (1986-12-01), Petit et al.
"On-Wafer and On-Module Chip Testing", by Joni, IBM Tech. Disc. Bull., vol. 26, #8, 1/84, pp. 4312-4323.
"Checking of Check Circuitry", by Baron et al, IBM Tech. Disc. Bull, vol. 11, #11, 4/69, pp. 1398-1399.

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