Electronic digital logic circuitry – Multifunctional or programmable – Array
Reexamination Certificate
2007-06-15
2009-08-18
Chang, Daniel D (Department: 2819)
Electronic digital logic circuitry
Multifunctional or programmable
Array
C326S046000
Reexamination Certificate
active
07576562
ABSTRACT:
A diagnosable structured logic array and associated process is provided. A base cell structure is provided comprising a logic unit comprising a plurality of input nodes, a plurality of selection nodes, and an output node, a plurality of switches coupled to the selection nodes, where the switches comprises a plurality of input lines, a selection line and an output line, a memory cell coupled to the output node, and a test address bus and a program control bus coupled to the plurality of input lines and the selection line of the plurality of switches. A state on each of the plurality of input nodes is verifiably loaded and read from the memory cell. A trusted memory block is provided. The associated process is provided for testing and verifying a plurality of truth table inputs of the logic unit.
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Gambles Jody
Maki Gary K.
Miles Lowell
Whitaker Sterling
Chang Daniel D
The United States of America as represented by the United States
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