Devices and methods for preventing capacitor leakage

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S298000, C257S296000, C257S306000, C257S311000, C257SE21388, C257SE21388

Reexamination Certificate

active

07745865

ABSTRACT:
Devices and methods for preventing capacitor leakage caused by sharp tip. The formation of sharp tip is avoided by a thicker bottom electrode which fully fills a micro-trench that induces formation of the sharp tip. Alternatively, formation of the sharp tip can be avoided by recessing the contact plug to substantially eliminate the micro-trench.

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patent: 2005/0051824 (2005-03-01), Iizuka et al.

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