Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2006-04-26
2009-08-18
Wojciechowicz, Edward (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257S538000, C438S132000, C438S600000, C365S094000
Reexamination Certificate
active
07576407
ABSTRACT:
Electrically programmable integrated fuses are provided for low power applications. Integrated fuse devices have stacked structures with a polysilicon layer and a conductive layer formed on the polysilicon layer. The integrated fuses have structural features that enable the fuses to be reliably and efficiently programmed using low programming currents/voltages, while achieving consistency in fusing locations. For example, programming reliability and consistency is achieved by forming the conductive layers with varied thickness and forming the polysilicon layers with varied doping profiles, to provide more precise localized regions in which fusing events readily occur.
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Korean Office Action dated Feb. 26, 2008 for corresponding Korean Appln. No. 10-2007-0040031.
Ko Young-Gun
Ku Ja-Hum
Sun Min-chul
Weiser Robert
F. Chau & Associates LLC
Samsung Electronics Co,. Ltd.
Wojciechowicz Edward
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