Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-29
2010-02-02
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07657851
ABSTRACT:
Device, system and method of correcting an integrated circuit design. For example, a method includes receiving a list of one or more root points for an active netlist that requires logic correction, wherein the root points correlate between elements of the active netlist and elements of a re-synthesized netlist that is based on a high-level correction for the integrated circuit design; automatically identifying in the active netlist a driving logic cone for at least one of the root points; and automatically identifying in the re-synthesized netlist a driving logic cone for the respectively correlated root point, including one or more corrected logic elements that correspond to the one or more identified flawed logic elements.
REFERENCES:
patent: 5249133 (1993-09-01), Batra
patent: 6904576 (2005-06-01), Ng et al.
patent: 7240316 (2007-07-01), Regnier
patent: 7441215 (2008-10-01), Sahrling
patent: 2004/0030999 (2004-02-01), Ng et al.
Yang, Yu-Sen, et al., “Extraction Error Modeling and Automated Model Debugging in High-Performance Custom Designs”, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jul. 2006, pp. 763-776, v 14, n 7.
Granovsky Ilya
Yeger Boaz
Erez Suzanne
Garbowski Leigh Marie
International Business Machines - Corporation
LandOfFree
Device, system, and method for correction of integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device, system, and method for correction of integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device, system, and method for correction of integrated... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4158817