Device isolation layer for a semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating

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257509, H01L 2358

Patent

active

060085266

ABSTRACT:
A field oxide layer for a semiconductor device includes an upper portion of first thickness extending above the major surface of a semiconductor substrate, and a lower portion of second thickness extending below the major surface of the semiconductor substrate. The ratio of first thickness to second thickness is not less than 1 to 2.

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IBM Technical Disclosure Bulletin, vol. 27, No. 11, Apr. 1985, pp. 6703.

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