Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-03-14
2006-03-14
Ho, Hoai (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S230030, C365S230040
Reexamination Certificate
active
07012844
ABSTRACT:
A device information writing circuit features a redundancy fuse set for selectively performing a repair operation or a device information writing operation. The repair operation is performed with a fuse set having the least frequency of use from the redundancy fuse sets of a row address. Additionally, the number of fuse sets is reduced because the device information including the LOT number, the wafer number and row/column coordinates is written as different data in each bank by a fuse cutting method.
REFERENCES:
patent: 2002/0031017 (2002-03-01), Yumoto
patent: 2002/0044489 (2002-04-01), Kim
patent: 2003/0072199 (2003-04-01), Honda et al.
patent: 2003/0076714 (2003-04-01), Suzuki
patent: 2003/0103394 (2003-06-01), Koshikawa
patent: 2003/0117869 (2003-06-01), Hidaka
Graham Kretelia
Heller Ehrman LLP
Ho Hoai
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