Device identification using a memory profile

Electrical computers and digital processing systems: memory – Storage accessing and control – Memory configuring

Reexamination Certificate

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Details

C711S202000

Reexamination Certificate

active

06889305

ABSTRACT:
In accordance with an embodiment of the present invention, a method for identification of a semiconductor device having a plurality of memory blocks, comprises accessing a memory profile for the semiconductor device based at least in part on an identification of defective memory blocks of the semiconductor device and determining a unique identifier for the semiconductor device based at least in part on the memory profile of the semiconductor device.

REFERENCES:
patent: 5818738 (1998-10-01), Effing
patent: 6161213 (2000-12-01), Lofstrom
patent: WO0165372 (2001-09-01), None
World Wide Web, http://www.siliconstrategies.com/story/OEG20000207S0002, J. Robert Lineback, SlidTech Rolls Out ‘Silicon Fingerprinting’ for Chip Tracing, Fraud Fighting, Semiconductor Business News, Feb. 7, 2000, 3 pages.
Word Wide Web, http://www.ebnew s.com/printableArticle?doc_id= OEG20000207S0025, Crista Souza, “SlidTech to Debut Chip-Tagging Technology at ISSCC,” CMP Media, LLC, Feb. 7, 2000, 2 pages.
Word Wide Web, http://www.slidtech.com/pages/650798/index.htm, Steve Sapiro, “Hot Off the Press—SlidTech and LogicVision Sign a Joint Technology Agreement,” printed on Oct. 10, 2002, 4 pages.
World Wide Web, http://www.eetimes.com/printableArticles?doc_id= OEG20000207S0026, Stan Runyon, EE Times, Feb. 7, 2000, 3 pages.

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