Device having improved surface planarity prior to MRAM bit...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S421000, C257S422000, C257SE21665

Reexamination Certificate

active

10734201

ABSTRACT:
The present invention provides a method of fabricating a portion of a memory cell, the method comprising providing a first conductor in a trench which is provided in an insulating layer and flattening an upper surface of the insulating layer and the first conductor, forming a material layer over the flattened upper surface of the insulating layer and the first conductor and flattening an upper portion of the material layer while leaving intact a lower portion of the material layer over the insulating layer and the first conductor.

REFERENCES:
patent: 5354712 (1994-10-01), Ho et al.
patent: 5940319 (1999-08-01), Durlam et al.
patent: 6110648 (2000-08-01), Jang
patent: 6174737 (2001-01-01), Durlam et al.
patent: 6181013 (2001-01-01), Liu et al.
patent: 6211090 (2001-04-01), Durlam et al.
patent: 6555858 (2003-04-01), Jones et al.
patent: 6709874 (2004-03-01), Ning
patent: 2002/0098705 (2002-07-01), Low

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Device having improved surface planarity prior to MRAM bit... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device having improved surface planarity prior to MRAM bit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device having improved surface planarity prior to MRAM bit... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3930680

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.