Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-09-13
2005-09-13
Nguyen, Tuan H. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S295000, C257S532000, C438S003000
Reexamination Certificate
active
06943397
ABSTRACT:
A device having a capacitor element includes: an underlying body having a non-orientated first surface; a lower electrode formed on the first surface of the underlying body, the lower electrode containing conductive metal oxide and not containing noble metal, such as LaNiO3, the conductive metal oxide having a (0 0 1) orientated ABO3type pervskite structure; a ferroelectric layer formed on the lower electrode, having a rhombohedral ABO3type pervskite structure, the ferroelectric layer being preferentially (0 0 1) orientated in conformity with the orientation of the lower electrode, and an upper electrode formed on the ferroelectric layer.
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patent: 9-245525 (1997-09-01), None
J.F. Scott, et al.;Quantitative measurement of space-charge effects in lead zirconate-titanate memories; Journal of Applied Physics, vol. 70, No. 1, Jul. 1, 1991, pp. 382-388 (Discussed on page 2 of specification).
Hida Masaharu
Kondo Masao
Kurasawa Masaki
Kurihara Kazuaki
Maruyama Kenji
Fujitsu Limited
Nguyen Tuan H.
Westerman Hattori Daniels & Adrian LLP
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