Device for the examination of optical properties of surfaces

Details Device for the examination of optical properties of surfaces Device for the examination of optical properties of surfaces

2005-07-06

2008-10-07

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Surface roughness

C356S446000

Reexamination Certificate

active

07433055

ABSTRACT:
A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

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patent: 2006/0033058 (2006-02-01), Schwarz
patent: 2006/0033922 (2006-02-01), Sperling et al.
patent: 2006/0274317 (2006-12-01), Schwarz et al.
patent: 2008/0013074 (2008-01-01), Schwarz et al.

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