Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate
2007-05-23
2009-06-09
Berman, Jack I (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Analyte supports
C250S304000, C250S307000, C356S244000, C359S398000
Reexamination Certificate
active
07544953
ABSTRACT:
A device, method and system for preparing and storing samples for microscopic analysis is disclosed. The device provides a reservoir that can be attached to a displacement pipette thereby filling the reservoir with reagents desired for preparing the samples for microscopic analysis. In some embodiments, the specimen may be contained on a transmission electron microscope (TEM) grid. In other embodiments, the sample may be a light microscope (LM) specimen or a scanning electron microscope (SEM) specimen. In yet another embodiment, the invention provides a method of preparing samples for microscopic examination including a device for preparing TEM grids with, a device for preparing TEM, SEM or LM specimens with and a device for storing both grids and specimens in. In yet another embodiment, the invention provides a system for tracking the preparation, analysis and histological evaluation of multiple samples while also providing for their long term storage.
REFERENCES:
patent: 4363783 (1982-12-01), Sitte
patent: 7122155 (2006-10-01), Waterbury et al.
patent: WO 2006012486 (2006-02-01), None
Berman Jack I
Godfrey & Kahn S.C.
Microscopy Innovations, LLC
Stewart Alan R.
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