Device for measuring parameters of an electronic device

Details Device for measuring parameters of an electronic device Device for measuring parameters of an electronic device

2005-04-05

2005-04-05

Tran, Thien F (Department: 2811)

Active solid-state devices (e.g., transistors, solid-state diode

Field effect device

Having insulated electrode

C257S350000, C257S351000

Reexamination Certificate

active

06876036

ABSTRACT:
The inherent capacitance between the substrate and the drain of an SOI device is utilized as part of a circuit. The substrate is connected to a sensing pin brought external to the chip, and other electronic components are hooked up to form a circuit that includes and operates with the inherent capacitance between the substrate and the drain.

REFERENCES:
patent: 5686735 (1997-11-01), Sim

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