Device for jitter measurement and method thereof

Details Device for jitter measurement and method thereof Device for jitter measurement and method thereof

2011-06-07

2011-06-07

Bui, Bryan (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C375S226000

Reexamination Certificate

active

07957923

ABSTRACT:
The device for jitter measurement and a method thereof are provided. The device for jitter measure includes a signal retrieving module, a signal amplifying module, an edge detecting module, and a time-to-digital converting module. The signal retrieving module receives a signal-under-test, and retrieves a first pulse signal having a pulse width equal to a period of the signal-under-test. The signal amplifying module amplifies the pulse width of the first pulse signal and thereby generates a second pulse signal. The edge detecting module detects a rising edge and a falling edge of the second pulse signal, and generates a first indication signal and a second indication signal according to the respective detected results. The time-to-digital converting module converts the pulse width of the second pulse signal existed in time domain to a digital signal according to the first indication signal and the second indication signal.

REFERENCES:
patent: 6687629 (2004-02-01), Yamaguchi et al.
patent: 7496137 (2009-02-01), Ichiyama et al.
patent: 2004/0062301 (2004-04-01), Yamaguchi et al.
patent: 2007/0118314 (2007-05-01), Ichiyama et al.
Authored by Chan, at al., article titled “A jitter characterization system using a component-invariant vernier delay line”, adopted from Ieee transactions on very large scale integration (VLSI) systems, vol. 12, No. 1, Jan. 2004, p. 79-95.

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