4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system

Soon-Jyh Chang

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Device for jitter measurement and method thereof

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Stage-resolution scalable opamp-sharing technique for...

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2233901

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