Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-10
2006-10-10
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C700S115000, C257S758000
Reexamination Certificate
active
07120886
ABSTRACT:
A device for determining the version of metal mask utilized for producing a given metal layer (Metal3) in an integrated circuit including a plurality of metal layers (Metal0, . . . , Metal3), and any modification made to the given metal layer (Metal3) requiring generation of a new version of the corresponding metal mask. The device includes a cell (Cell) integrated into the metal layer (Metal3) including at least a first voltage source (Vdd) for supplying a first voltage level, at least a second voltage source (GND) for supplying a second voltage level, and an output bus composed of at least one conductor wire (S1, S2) connected selectively to one of the first and second voltage sources as a function of the version of metal mask used to produce the metal layer, so as to generate a binary output signal representative of the mask version utilized.
REFERENCES:
patent: 5399505 (1995-03-01), Dasse et al.
patent: 5459355 (1995-10-01), Kreifels
patent: 5504369 (1996-04-01), Dasse et al.
patent: 5594273 (1997-01-01), Dasse et al.
patent: 5654588 (1997-08-01), Dasse et al.
patent: 5723876 (1998-03-01), Ray
patent: 5787012 (1998-07-01), Levitt
patent: 5895962 (1999-04-01), Zheng et al.
patent: 6190972 (2001-02-01), Zheng et al.
patent: 6194738 (2001-02-01), Debenham et al.
patent: 6365421 (2002-04-01), Debenham et al.
patent: 6514780 (2003-02-01), Manyoki
patent: 6559544 (2003-05-01), Roth et al.
patent: 6570254 (2003-05-01), DeForge et al.
patent: 6629239 (2003-09-01), Steele, Jr.
patent: 2001/0013658 (2001-08-01), Manyoki
patent: 2002/0006676 (2002-01-01), Debenham et al.
patent: 2002/0015898 (2002-02-01), Sung et al.
patent: 2002/0084331 (2002-07-01), Reinschmidt et al.
patent: 2003/0013025 (2003-01-01), Tawara et al.
patent: 2004/0064801 (2004-04-01), Venkatraman et al.
patent: 2005/0144582 (2005-06-01), Venkatraman et al.
patent: 2 362 265 (2001-11-01), None
patent: 11224278 (1999-08-01), None
Fleit Kain Gibbons Gutman Bongini & Bianco P.L.
Gutman Jose
Jorgenson Lisa K.
Kik Phallaka
STMicroelectronics S.A.
LandOfFree
Device for determining the mask version utilized for each... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device for determining the mask version utilized for each..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for determining the mask version utilized for each... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3658122