Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-02-21
1996-03-19
Snow, Walter E.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324765, 371 214, G04R 2708, G04R 3126, G11C 2900
Patent
active
055006019
ABSTRACT:
The invention is a device to detect the logic state of a component whose impedance depends on this state, the device including means to generate a current and a measurement voltage so that the current consumption remains constant during cell detection regardless of the state detected, the device also including means to detect the logic state of the component.
REFERENCES:
patent: 4136292 (1979-01-01), Suzuki et al.
patent: 4519076 (1965-05-01), Priel et al.
patent: 4720671 (1968-11-01), Tada et al.
patent: 4774692 (1980-09-01), Oishi et al.
Fournel Richard
Lisart Mathieu
SGS-Thomson Microelectronics S.A.
Snow Walter E.
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