Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate
2007-02-13
2007-02-13
Chase, Shelly (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Skew detection correction
Reexamination Certificate
active
10164770
ABSTRACT:
A device and method for detecting a delay time of a circuit is provided. A test signal is fed into the circuit, the test signal including a signal edge, the occurrence of which is related to a reference time. The output signal of the circuit is sampled at predetermined times to obtain a sequence of sample values, with a first state being associated with a sample value when the output signal has a first signal value and a second state being associated with a sample value when the output signal has a second signal value. A counter counts the sample values of the sequence, to which an equal state is associated, to obtain counted sample values. A delay time is calculated using the counted number of sample values.
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patent: 6105157 (2000-08-01), Miller
patent: 6369601 (2002-04-01), Ishigaki
Schrüfer, E.: “Elektrische Messtechnik” [Electric Measurement Technique], Carl Hanser Verlag München, 1983, pp. 313-315.
Keim Martin
Kund Michael
Chase Shelly
Infineon - Technologies AG
Stemer Werner H.
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