Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2008-03-25
2008-03-25
Baderman, Scott (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S037000, C714S799000, C702S117000
Reexamination Certificate
active
10463863
ABSTRACT:
A device for aiding the location of a failure within a complex system may include a database that stores diagnostic aid rules; a detector that detects a failure, if any, of the complex system and provides, upon a failure, information relating to the origin of this failure; and a central unit that determines, for any failure detected, on the basis of the diagnostic aid rules and the failure origination information, the element or elements of the complex system that may have caused the failure. Additionally, the central unit determines the corresponding probability that each element caused the failure for presentation to a user.
REFERENCES:
patent: 5539652 (1996-07-01), Tegethoff
patent: 5748497 (1998-05-01), Scott et al.
patent: 5983364 (1999-11-01), Bortcosh et al.
patent: 6205563 (2001-03-01), Lewis
patent: 6226760 (2001-05-01), Burkhardt et al.
patent: 6338149 (2002-01-01), Ciccone et al.
patent: 6400134 (2002-06-01), Schuntermann
patent: 6587960 (2003-07-01), Barford et al.
patent: 6628304 (2003-09-01), Mitchell et al.
patent: 6633782 (2003-10-01), Schleiss et al.
patent: 6691249 (2004-02-01), Barford et al.
patent: 6751577 (2004-06-01), Sasaki et al.
patent: 6792385 (2004-09-01), Parker et al.
patent: 6856939 (2005-02-01), Everts et al.
patent: 6892163 (2005-05-01), Herzog et al.
patent: 6892317 (2005-05-01), Sampath et al.
patent: 6912671 (2005-06-01), Christensen et al.
patent: 6948141 (2005-09-01), Satya et al.
patent: 6988053 (2006-01-01), Namaky
patent: 7158917 (2007-01-01), Bickford
patent: 2002/0010560 (2002-01-01), Balachandran
patent: 2002/0019870 (2002-02-01), Chirashnya et al.
patent: 2002/0050836 (2002-05-01), Farnworth et al.
patent: 2002/0097254 (2002-07-01), Simmons
patent: 2003/0084146 (2003-05-01), Schilling et al.
patent: 2003/0110412 (2003-06-01), Neville
patent: 2003/0195675 (2003-10-01), Felke et al.
patent: 2004/0153862 (2004-08-01), Grellmann et al.
patent: 2004/0225951 (2004-11-01), Rose et al.
patent: 2006/0136104 (2006-06-01), Brozovich et al.
I. Beniaminy et al., “Experience in diagnosing a remote, tele-controlled unit using the AITEST expert system,” Test Conference, 1993. Proceedings., International Baltimore, MD, USA Oct. 17-21, 1993, New York, NY, USA, IEEE, Oct. 17, 1993, pp. 37-44, XP010148272.
Laurence J. Cooper et al., “Reasoning From Uncertain Data: A Bit Enhancement” Automatic Testing in the Next Decade and in the 21st. Century. Philadelphia, Sep. 25-28, 1989, Proceedings of the International Automatic Testing Conference, New York, IEEE, US, vol. Conf. 25, Sep. 25, 1989, pp. 146-149, XP000078705.
John W. Sheppard et al., “A neural network for evaluating diagnostic evidence” Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National Dayton, OH, USA May 20-24, 1991, New York, NY, USA, IEEE, US, May 20, 1991, pp. 717-723, XP010048214.
Mary Nolan et al., “Re-engineering legacy tech manual's troubleshooting procedures into smart model-based diagnostics” AUTOTESTCON, 97, 1997 IEEE AUTOTESTCON Proceedings Anaheim, CA, USA Sep. 22-25, 1997, New York, NY, USA, IEEE, US, Sep. 22, 1997, pp. 1-7, XP010252988.
Baderman Scott
Eurocopter
Stevens Davis Miller & Mosher LLP
Truong Loan
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