Device for adjusting the position and the orientation around an

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

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H01J 3720

Patent

active

044058659

ABSTRACT:
The device includes a support tube passing through the wall of the column of the microscope, whose inner end is supported on an inner structure of the microscope by a hemispherical surface. This is supported in the wall around the orientation axis and is connected to the sample-holder which it traverses by control means enabling the position of the sample-holder to be adjusted in the support tube along three axes of a reference dihedral. The control means comprise an annular diaphragm for suspending the sample-holder in the support tube close to the center of the support surface. Lever and push-rod connecting linkages of high stiffness enable the sample-holder to be tilted around the center of the diagram in two perpendicular planes.

REFERENCES:
patent: 2910590 (1954-10-01), van Dorsten et al.
patent: 4101778 (1978-06-01), von Rauch et al.
"Goniometer Stage for Electron Microscopes", Philips.

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