Device designed to assess the brightness of a surface more parti

Optics: measuring and testing – By polarized light examination – Of surface reflection

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G01N 2157, G01N 33483

Patent

active

051988755

ABSTRACT:
A device for measuring the brightness of a surface includes a light source to send an incident beam onto the surface and a polarizer and two analyzers one for analyzing the reflected light and the other for analyzing the diffuse reflection from the surface at a selected point of incidence; light-sensitive photodetector means are provided to receive light from the analyzers; the incident light impinges on the surface under examination at an angle of between 0.degree. and 90.degree. with the incident beam polarization being perpendicular to the plane of incidence; the analyzers are located to differentiate between parallel and perpendicular polarization to provide differences in the assessment of specular and diffuse brightness.

REFERENCES:
patent: 2866375 (1958-12-01), Wells
patent: 2947212 (1960-08-01), Woods
patent: 3060793 (1962-10-01), Wells
patent: 3904293 (1975-09-01), Gee
patent: 4398541 (1983-08-01), Pugliese
patent: 4482250 (1984-11-01), Hirvonen et al.
patent: 4846184 (1989-07-01), Comment et al.
Patent Abstracts of Japan vol. 13 No. 475 (P-950) [3823] Oct. 27, 1989.
Vol. 5 No. 32 (P. 50) (704) Feb. 27, 1991.
IBM Technical Disclosure Bulletin vol. 27 No. 9 Feb. 1985.

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