Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1991-08-09
1993-03-30
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
Of surface reflection
G01N 2157, G01N 33483
Patent
active
051988755
ABSTRACT:
A device for measuring the brightness of a surface includes a light source to send an incident beam onto the surface and a polarizer and two analyzers one for analyzing the reflected light and the other for analyzing the diffuse reflection from the surface at a selected point of incidence; light-sensitive photodetector means are provided to receive light from the analyzers; the incident light impinges on the surface under examination at an angle of between 0.degree. and 90.degree. with the incident beam polarization being perpendicular to the plane of incidence; the analyzers are located to differentiate between parallel and perpendicular polarization to provide differences in the assessment of specular and diffuse brightness.
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patent: 4482250 (1984-11-01), Hirvonen et al.
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Patent Abstracts of Japan vol. 13 No. 475 (P-950) [3823] Oct. 27, 1989.
Vol. 5 No. 32 (P. 50) (704) Feb. 27, 1991.
IBM Technical Disclosure Bulletin vol. 27 No. 9 Feb. 1985.
Bazin Roland
Chardron Herve
Chommeloux Luc
Obadia Gerard
"L'Oreal"
Rosenberger Richard A.
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