Device and process for linear measurement of fiber sliver thickn

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36447015, 19239, G06F 1900

Patent

active

057966354

ABSTRACT:
The invention relates to a process for rapid measurement of thickness or mass of a fiber sliver in a draw-frame or card (so-called "regulation"). The object of the invention is to accelerate the process of measuring according to the state of the art while maintaining measuring precision and even improving it. For this, a process for rapid measuring of the thickness or mass of a fiber sliver in a machine processing fiber slivers, such as a draw-frame or card, in which the primary measuring signal (u.sub.1, u.sub.1 ') of the measurement indicator is taken via a signal-influencer which modifies the primary signal by segment or point before transmission in the form of measuring signal (u.sub.2, u.sub.2 '); the modification is predetermined by a characteristic line stored previously by segment or point which is based on a relationship (K1) measured by point between defined predetermined thicknesses at the measurement indicator and the primary measurement signal (u.sub.1 u.sub.1 ') measured at that moment.

REFERENCES:
patent: 4064396 (1977-12-01), Panarello
patent: 4375921 (1983-03-01), Morander
patent: 5230125 (1993-07-01), Clement et al.
patent: 5384934 (1995-01-01), Dammig
patent: 5461757 (1995-10-01), Leifeld
patent: 5485082 (1996-01-01), Wisspeintner et al.
patent: 5583781 (1996-12-01), Denz et al.

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