Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-10
2009-12-22
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C702S057000, C702S058000, C702S059000, C702S182000, C702S183000, C702S185000, C702S186000, C324S500000, C324S512000, C324S527000, C324S528000
Reexamination Certificate
active
07636903
ABSTRACT:
A method and device for testing an electric circuit, wherein exhaustive electric circuit modulation is not required yet circuit errors can be recognized in a reliable manner is provided. A marking signal is produced, indicating a predefined circuit state that might occur in specific components of an electric circuit, wherein a transformed network list is formed from an original network list describing the circuit, whereby all electric components of at least one predefined component group, with regard to a respective connection pair, are treated as short-circuited, all network nodes connected by one or several components that are to be treated as short-circuited are respectively combined to form an equivalence category, wherein respectively all states of the associated network nodes are assigned to each equivalence category, it is possible to determine whether and in which components the predefined circuit state can occur by taking into account the equivalence categories.
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Baader Peter
Neunhoeffer Tilman
Do Thuan
Doan Nghia M
Infineon - Technologies AG
Slater & Matsil L.L.P.
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