Static information storage and retrieval – Read/write circuit – Testing
Patent
1999-02-25
2000-01-04
Le, Vu A.
Static information storage and retrieval
Read/write circuit
Testing
365205, 365208, G11C 700
Patent
active
060117362
ABSTRACT:
As part of a memory array, a circuit is provided for altering the drive applied to an access transistor that regulates electrical communication within the memory array. In one embodiment, the circuit is used to alter the drive applied to a sense amp's voltage-pulling transistor, thereby allowing modification of the voltage-pulling rate for components of the sense amp. A sample of test data is written to the memory array and read several times at varying drive rates in order to determine the sense amp's ability to accommodate external circuitry. In another embodiment, the circuit is used to alter the drive applied to a bleeder device that regulates communication between the digit lines of the memory array and its cell plate. Slowing said communication allows defects within the memory array to have a more pronounced effect and hence increases the chances of finding such defects during testing. The circuit is configured to accept and apply a plurality of voltages, either through a contact pad or from a series of discrete voltage sources coupled to the circuit.
REFERENCES:
patent: 5042011 (1991-08-01), Casper et al.
patent: 5175450 (1992-12-01), Chern
patent: 5297087 (1994-03-01), Porter
patent: 5343433 (1994-08-01), Duvvury et al.
patent: 5388077 (1995-02-01), Sanada
patent: 5469393 (1995-11-01), Thomann
patent: 5500824 (1996-03-01), Fink
patent: 5544108 (1996-08-01), Thomann
patent: 5561635 (1996-10-01), Tada et al.
patent: 5577051 (1996-11-01), McClure
patent: 5604704 (1997-02-01), Atsumo
patent: 5629943 (1997-05-01), McClure
patent: 5646880 (1997-07-01), Yuh
patent: 5689467 (1997-11-01), Hashimoto
patent: 5748544 (1998-05-01), Hashimoto
patent: 5768200 (1998-06-01), Liu et al.
Beigel Kurt D.
Cutter Douglas J.
Brantley Charles
Le Vu A.
Micro)n Technology, Inc.
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