Device and method for package warp compensation in an...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With provision for cooling the housing or its contents

Reexamination Certificate

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C257S706000, C257S713000, C257S714000, C257S717000, C257S718000, C257S719000, C257S720000, C257S721000, C257S722000

Reexamination Certificate

active

07102226

ABSTRACT:
A device and method for designing and manufacturing an integrated heat spreader so that the integrated heat spreader will have a flat surface on which to mount a heat sink after being assembled into a package and exposed to the heat of a die. This device and method for designing and manufacturing an integrated heat spreader would generate a heat spreader that would be built compensate for deformations resulting from (1) physical manipulation during assembly (2) thermal gradients during operation and (3) differing rates of expansion and contraction of the package materials coupled with multiple package assembly steps at elevated temperatures so that one surface of the integrated heat spreader would have a flat shape.

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patent: 6203191 (2001-03-01), Mongan
patent: 6466446 (2002-10-01), Nagy et al.
patent: 6848172 (2005-02-01), Fitzgerald et al.
patent: 60-46037 (1985-03-01), None
patent: 2-77143 (1990-03-01), None
Kelly, G. , et al., “Accurate Prediction of PQFP Warpage”,IEEE Proceedings of the Electronic Components and Technology Conference, 44, Washington,(1994),102-106.
Metrol, A. , “Stress Analysis and Thermal Characterization of a High Pin Count PQFP”,Transactions of the ASME: Journal of Electronic Packaging, 114, (1992),211-220.
Zhang, X. , et al., “Thermo-Mechanical Analysis for a Multi Chip Build Up Substrate Based Package”,Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2001 (Cat No. 01TH8548), (2001),67-72.

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