Optics: measuring and testing – Surface roughness
Reexamination Certificate
2007-02-13
2007-02-13
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Surface roughness
C356S425000, C356S405000, C356S406000, C356S402000
Reexamination Certificate
active
10854926
ABSTRACT:
A method for determining the properties of surfaces wherein a first process step specified radiation emits from at least one radiation source to a measuring surface, in further process steps the radiation reflected and/or scattered off the measuring surface is detected by a plurality of image-capturing components, and a signal is generated which specifies at least one parameter of the radiation detected by the image-capturing components. In further process steps the first signals are grouped based on predetermined criteria to form group signals, and at least one group-specific evaluation figure is computed, and a dependent statistical parameter correlating with at least one measuring surface remission characteristic. Finally at least one statistical parameter is read out in dependence on the predetermined criterion for grouping said first signals. The properties of the surface are specified by a relation between at least two statistical parameters.
REFERENCES:
patent: 4976545 (1990-12-01), Kipphan et al.
patent: 6263291 (2001-07-01), Shakespeare et al.
patent: 7006229 (2006-02-01), Sperling et al.
BYK Gardner GmbH
Greer Burns & Crain Ltd.
Toatley , Jr. Gregory J.
Ton Tri
LandOfFree
Device and method for determining the properties of surfaces does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device and method for determining the properties of surfaces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for determining the properties of surfaces will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3817549