Device and method for correcting defects in x-ray images

Image analysis – Applications – Biomedical applications

Reexamination Certificate

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Reexamination Certificate

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07864993

ABSTRACT:
A method for correcting defects in X-ray images includes identifying potentially defective picture elements (p) in X-ray images (I), created during normal operation, by comparing a value (W(p)) of the picture elements with corresponding values in a neighborhood (n(p)). If a picture element (p) has been classified as “potentially defective” in more than a specified percentage of X-ray images, it is entered in a defect map which is refreshed on a continuous basis. The defect map can then be used to correct other X-ray images.

REFERENCES:
patent: 6035072 (2000-03-01), Read
patent: 6246746 (2001-06-01), Conrads et al.
patent: 6747697 (2004-06-01), Lin et al.
patent: 2001/0038706 (2001-11-01), Eck et al.
patent: 2002/0065611 (2002-05-01), Boehm et al.
patent: 2003/0215120 (2003-11-01), Uppaluri et al.
patent: WO0205213 (2002-01-01), None

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