Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2000-12-12
2003-06-10
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C324S638000, C324S637000, C703S002000, C703S014000, C714S055000, C714S024000, C714S037000
Reexamination Certificate
active
06578181
ABSTRACT:
FIELD OF THE INVENTION
The present invention relates to a device and a method for analyzing waveform propagation of a digital signal in a circuit based on circuit diagram information or the like, and a computer-readable recording medium recorded with a program for making a computer execute the method according to the present invention.
BACKGROUND OF THE INVENTION
FIG. 16
is a diagram showing a structure and a data flow of a conventional circuit analyzing device. This circuit analyzing device includes a circuit diagram information generating section
81
for supporting preparation of a circuit diagram and for generating circuit diagram information (information on a circuit diagram) D
81
, a layout pattern information generating section
82
for generating layout pattern information (information on a layout pattern) of this circuit, and an element information extracting section
83
for extracting element information (information on a circuit element and a parasitic element) D
82
from the layout pattern generated by the layout pattern information generating section
82
.
Further, this circuit analyzing device includes a circuit connection information extracting section
84
for extracting net list information (circuit connection information) D
83
of the whole circuit, based on the circuit diagram information D
81
generated by the circuit diagram information generating section
81
or the element information D
82
extracted by the element information extracting section
83
, a circuit simulation section
85
for simulating the analysis of a transient response of a circuit using the net list information D
83
extracted by the circuit connection information extracting section
84
, and a waveform display section
86
for displaying a waveform of a result of the analysis of the circuit simulation section
85
.
FIG. 17
is a flowchart showing a flow of the operation of the conventional circuit analyzing device. First, the circuit diagram information generating section
81
generates the circuit diagram information D
81
or the layout pattern information generating section
82
generates the layout pattern information, and the element information extracting section
83
extracts the element information D
82
(S
81
). Subsequently, the circuit connection information extracting section
84
extracts the net list information D
83
from the circuit diagram information D
81
or from the element information D
82
(S
82
). Subsequently, the circuit simulation section
85
simulates the analysis of a transient response of a circuit using the net list information D
83
(S
83
). Subsequently, the waveform display section
86
displays a waveform of a result of the analysis (S
84
). A user visually observes this waveform, and confirms the whole wiring to see whether there is a problem or not in the waveform propagation characteristics of the digital signal (S
85
).
In the conventional circuit analyzing device, however, a simulation is carried out for the whole circuit, and the user visually observes the waveform of a result of the analysis, and confirms whether there is a problem or not in the waveform propagation characteristics of the digital signal. Therefore, there has been a problem that there is a reduction in the reliability in the decision made on the waveform propagation characteristics of each wiring of the circuit. Further, there has been a problem that substantial time and labor are required for analyzing the circuit.
SUMMARY OF THE INVENTION
It is an object of this invention to provide, a device and a method for analyzing a circuit that can improve the reliability in the decision made on the waveform propagation characteristics of each wiring of the circuit and that can decrease the time and labor required for analyzing the circuit, and a computer-readable recording medium recorded with a program for making a computer execute the method according to the present invention.
According to one aspect of this invention, there is provided a circuit analyzing device comprising a wiring model information generating unit for generating wiring model information for each wiring of a circuit; and an analyzing unit for analyzing waveform propagation characteristics of each wiring model information that has been generated by the wiring model information generating unit. The wiring model information generating unit generates wiring model information for each wiring of a circuit, and the analyzing unit analyzes waveform propagation characteristics of each wiring model information that has been generated by the wiring model information generating unit. Therefore, it is possible to obtain quantitative information for making a decision, and it becomes easily possible to make a secure decision for each wiring.
Further, the wiring model information generating unit generates the wiring model information including LC circuit parasitic and RC circuit parasitic information based on layout information of the circuit. Therefore, it is possible to carry out a more suitable analysis particularly in the case of analyzing a circuit that processes a high-frequency digital signal of 1 GHz or above.
Further, the analyzing unit analyzes spectrum characteristics and/or S parameter characteristics. Therefore, it is possible to carry out a more detailed analysis.
Further, a deciding unit is provided for automatically deciding on whether each wiring is bad or good in waveform propagation, based on a result of the analysis of the analyzing unit. The deciding unit automatically decides whether each wiring is bad or good in waveform propagation. Therefore, it is more easily possible to make a secure decision on good or bad of each wiring.
Further, a correction circuit information generating unit is provided for generating correction circuit information on a correction circuit having an element for correcting waveform propagation characteristics added to a wiring that has been decided as bad by the deciding unit. The correction circuit information generating unit generates correction circuit information on a correction circuit having an element for correcting waveform propagation characteristics added to a wiring that has been decided as bad by the deciding unit. Therefore, it is possible to automatically correct the waveform propagation characteristics of the bad wiring.
Further, a layout information generating unit is provided for generating layout information of the correction circuit, based on the correction circuit information that has been generated by the correction circuit information generating unit, wherein the wiring model information generating unit generates wiring model information for each wiring of the correction circuit including LC circuit parasitic and RC circuit parasitic information, based on the layout information that has been generated by the layout information generating unit. Therefore, it is possible to obtain an optimum circuit by repeatedly carrying out the analysis of the correction circuit until when there is no bad wiring.
Further, an assigning unit is provided for assigning a part of a circuit as a part to be analyzed. The wiring model information generating unit generates wiring model information for only a part of the circuit that has been assigned by this assigning unit. Therefore, it is possible to further decrease the time required for analyzing the circuit.
According to another aspect of this invention, there is provided a circuit analyzing method comprising a wiring model information generating step for generating wiring model information for each wiring of a circuit; and an analysis step for analyzing waveform propagation characteristics of each wiring model information that has been generated at the wiring model information generating step. At the wiring model information generating step, wiring model information is generated for each wiring of a circuit, and at the analysis step, waveform propagation characteristics are analyzed for each wiring model information that has been generated at the wiring model information generating step. Therefore, it is possible to obtain quantitat
Dakeno Hiroyuki
Hisada Toshimasa
Leydig , Voit & Mayer, Ltd.
Mitsubishi Denki & Kabushiki Kaisha
Rossoshek Helen
Smith Matthew
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