Device and a method for testing disconnection by grouping bus li

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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341153, 324537, G01R 2726

Patent

active

056232110

ABSTRACT:
A device for testing for disconnection of bus lines of a semiconductor device includes switches having current ratios formed in a geometric series connected to ends of a group of n of the bus lines. At least one testing electrode is connected to the switches and at least one power electrode is connected to the group of n of the bus lines. A disconnection of one or more of the bus lines can be determined according to a current flowing through the testing electrode.

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